A two-dimensional simulation method for investigating charge transport behavior in 3-D charge trapping memory
Crossref DOI link: https://doi.org/10.1007/s11432-015-5475-7
Published Online: 2016-04-06
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lun, Zhiyuan
Du, Gang
Zhao, Kai
Liu, Xiaoyan
Wang, Yi
Text and Data Mining valid from 2016-04-06