Design for manufacturability and reliability in extreme-scaling VLSI
Crossref DOI link: https://doi.org/10.1007/s11432-016-5560-6
Published Online: 2016-05-06
Published Print: 2016-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Bei
Xu, Xiaoqing
Roy, Subhendu
Lin, Yibo
Ou, Jiaojiao
Pan, David Z.
Text and Data Mining valid from 2016-05-06