Modeling the impact of process and operation variations on the soft error rate of digital circuits
Crossref DOI link: https://doi.org/10.1007/s11432-016-9001-9
Published Online: 2017-02-24
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Song, Ruiqiang
Chen, Shuming
Liang, Bin
Chi, Yaqing
Chen, Jianjun
License valid from 2017-02-24