Impact of self-heating effects on nanoscale Ge p-channel FinFETs with Si substrate
Crossref DOI link: https://doi.org/10.1007/s11432-016-9106-x
Published Online: 2017-11-20
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yin, Longxiang
Shen, Lei
Jiang, Hai
Du, Gang
Liu, Xiaoyan
License valid from 2017-11-20