A study of residual characteristics in floating gate transistors
Crossref DOI link: https://doi.org/10.1007/s11432-017-9145-2
Published Online: 2017-09-14
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Jia
Zhao, Yiqiang
Xin, Ruishan
Ye, Mao
License valid from 2017-09-14