High energy proton and heavy ion induced single event transient in 65-nm CMOS technology
Crossref DOI link: https://doi.org/10.1007/s11432-017-9254-2
Published Online: 2017-11-06
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Jiaqi
Zhao, Yuanfu
Wang, Liang
Wang, Dan
Zheng, Hongchao
Chen, Maoxin
Shu, Lei
Li, Tongde
Li, Dongqiang
Guo, Wei
License valid from 2017-11-06