Defect characterization of amorphous silicon thin film solar cell based on low frequency noise
Crossref DOI link: https://doi.org/10.1007/s11432-017-9360-7
Published Online: 2018-04-11
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hu, Linna
He, Liang
Chen, Hua
Jia, Xiaofei
Hu, Ying
Ma, Hongmei
Guo, Dandan
Qin, Yu
Text and Data Mining valid from 2018-04-11
Article History
Received: 13 October 2017
Revised: 20 December 2017
Accepted: 23 January 2018
First Online: 11 April 2018