Systematic calibration of drift diffusion model for InGaAs MOSFETs in quasi-ballistic regime
Crossref DOI link: https://doi.org/10.1007/s11432-017-9472-x
Published Online: 2019-03-01
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Di, Shaoyan
Shen, Lei
Chang, Pengying
Zhao, Kai
Lu, Tiao
Du, Gang
Liu, Xiaoyan
Text and Data Mining valid from 2019-03-01
Article History
Received: 12 February 2018
Revised: 7 May 2018
Accepted: 29 May 2018
First Online: 1 March 2019