Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM
Crossref DOI link: https://doi.org/10.1007/s11432-017-9549-8
Published Online: 2018-10-22
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xie, Cheng
Chen, Yueyue
Chen, Jianjun
Zhang, Jizuo
Text and Data Mining valid from 2018-10-22
Article History
Received: 12 November 2017
Revised: 22 March 2018
Accepted: 14 August 2018
First Online: 22 October 2018