Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities
Crossref DOI link: https://doi.org/10.1007/s11432-019-2643-5
Published Online: 2019-10-22
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ji, Zhigang
Chen, Haibao
Li, Xiuyan
Text and Data Mining valid from 2019-10-22
Version of Record valid from 2019-10-22
Article History
Received: 19 August 2019
Revised: 26 August 2019
Accepted: 4 September 2019
First Online: 22 October 2019