Fully coupled electrothermal simulation of resistive random access memory (RRAM) array
Crossref DOI link: https://doi.org/10.1007/s11432-019-2667-5
Published Online: 2020-04-15
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Da-Wei
Zhao, Wen-Sheng
Chen, Wenchao
Xie, Hao
Yin, Wen-Yan
Text and Data Mining valid from 2020-04-15
Version of Record valid from 2020-04-15
Article History
Received: 2 July 2019
Revised: 13 September 2019
Accepted: 23 September 2019
First Online: 15 April 2020