Layout dependence of total-ionizing-dose response in 65-nm bulk Si pMOSFET
Crossref DOI link: https://doi.org/10.1007/s11432-019-2795-7
Published Online: 2020-10-27
Published Print: 2021-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ren, Zhexuan
An, Xia
Li, Gensong
Zhang, Xing
Huang, Ru
Text and Data Mining valid from 2020-10-27
Version of Record valid from 2020-10-27
Article History
Received: 13 December 2019
Revised: 19 January 2020
Accepted: 4 February 2020
First Online: 27 October 2020