Nano-scaled transistor reliability characterization at nano-second regime
Crossref DOI link: https://doi.org/10.1007/s11432-020-3088-3
Published Online: 2021-08-10
Published Print: 2021-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheng, Ran
Sun, Ying
Qu, Yiming
Liu, Wei
Liu, Fanyu
Gao, Jianfeng
Xu, Nuo
Chen, Bing
Text and Data Mining valid from 2021-08-10
Version of Record valid from 2021-08-10
Article History
Received: 1 May 2020
Revised: 8 July 2020
Accepted: 13 October 2020
First Online: 10 August 2021