A compact model for transition metal dichalcogenide field effect transistors with effects of interface traps
Crossref DOI link: https://doi.org/10.1007/s11432-020-3155-7
Published Online: 2021-03-08
Published Print: 2021-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xu, Yifei
Li, Weisheng
Fan, Dongxu
Shi, Yi
Qiu, Hao
Wang, Xinran
Text and Data Mining valid from 2021-03-08
Version of Record valid from 2021-03-08
Article History
Received: 8 November 2020
Revised: 4 January 2021
Accepted: 6 January 2021
First Online: 8 March 2021