Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices
Crossref DOI link: https://doi.org/10.1007/s11432-020-3197-8
Published Online: 2021-08-09
Published Print: 2022-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wong, Hei
Dong, Shurong
Chen, Zehua
Text and Data Mining valid from 2021-08-09
Version of Record valid from 2021-08-09
Article History
Received: 9 December 2020
Revised: 15 January 2021
Accepted: 24 February 2021
First Online: 9 August 2021