Experimental investigation of the gate voltage range of negative differential capacitance in ferroelectric transistors
Crossref DOI link: https://doi.org/10.1007/s11432-021-3268-0
Published Online: 2022-05-13
Published Print: 2022-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yang, Mengxuan
Huang, Qianqian
Su, Chang
Chen, Liang
Wang, Yangyuan
Huang, Ru
Text and Data Mining valid from 2022-05-13
Version of Record valid from 2022-05-13
Article History
Received: 31 January 2021
Revised: 14 April 2021
Accepted: 6 May 2021
First Online: 13 May 2022