Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors
Crossref DOI link: https://doi.org/10.1007/s11432-021-3330-8
Published Online: 2022-07-14
Published Print: 2022-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhan, Xuepeng
Chen, Jiezhi
Ji, Zhigang
Text and Data Mining valid from 2022-07-14
Version of Record valid from 2022-07-14
Article History
Received: 30 April 2021
Revised: 3 August 2021
Accepted: 31 August 2021
First Online: 14 July 2022