AtomGAN: unsupervised deep learning for fast and accurate defect detection of 2D materials at the atomic scale
Crossref DOI link: https://doi.org/10.1007/s11432-022-3757-x
Published Online: 2023-05-17
Published Print: 2023-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cheng, Danpeng
Sha, Wuxin
Xu, Zuo
Li, Shide
Yin, Zhigao
Lang, Yuling
Tang, Shun
Cao, Yuan-Cheng
Text and Data Mining valid from 2023-05-17
Version of Record valid from 2023-05-17
Article History
Received: 16 December 2022
Revised: 28 February 2023
Accepted: 5 May 2023
First Online: 17 May 2023