Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy
Crossref DOI link: https://doi.org/10.1007/s11433-018-9320-x
Published Online: 2019-01-02
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kai, CuiHong
Sun, XiaoJuan
Jia, YuPing
Shi, ZhiMing
Jiang, Ke
Ben, JianWei
Wu, You
Wang, Yong
Liu, HeNan
Li, XiaoHang
Li, DaBing
Text and Data Mining valid from 2019-01-02
Article History
Received: 19 September 2018
Accepted: 30 October 2018
First Online: 2 January 2019