Normal-Incidence Photoemission Electron Microscopy (NI-PEEM) for Imaging Surface Plasmon Polaritons
Crossref DOI link: https://doi.org/10.1007/s11468-014-9756-6
Published Online: 2014-08-20
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kahl, Philip
Wall, Simone
Witt, Christian
Schneider, Christian
Bayer, Daniela
Fischer, Alexander
Melchior, Pascal
Horn-von Hoegen, Michael
Aeschlimann, Martin
Meyer zu Heringdorf, Frank-J.
Text and Data Mining valid from 2014-08-20