Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction
Crossref DOI link: https://doi.org/10.1007/s11661-017-4313-5
Published Online: 2017-09-11
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lynch, Peter
Barnett, Matthew
Stevenson, Andrew
Hutchinson, Bevis
Text and Data Mining valid from 2017-09-11
Version of Record valid from 2017-09-11
Article History
Received: 22 February 2017
First Online: 11 September 2017