Size Effects of Hardness and Strain Rate Sensitivity in Amorphous Silicon Measured by Nanoindentation
Crossref DOI link: https://doi.org/10.1007/s11661-020-05648-w
Published Online: 2020-02-03
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jarząbek, Dariusz M.
Milczarek, Michał
Nosewicz, Szymon
Bazarnik, Piotr
Schift, Helmut
Text and Data Mining valid from 2020-02-03
Version of Record valid from 2020-02-03
Article History
Received: 24 September 2019
First Online: 3 February 2020