Effect of Si on the Growth Behavior of the Fe2Al5 Phase at Al-xSi(liquid)/Fe(solid) Interface During Holding by In-Situ Synchrotron Radiography
Crossref DOI link: https://doi.org/10.1007/s11661-020-05754-9
Published Online: 2020-04-15
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Naifang
Hu, Qiaodan
Yang, Fan
Lu, Wenquan
Ding, Zongye
Cao, Sheng
Yu, Liao
Ge, Xuan
Li, Jianguo
Text and Data Mining valid from 2020-04-15
Version of Record valid from 2020-04-15
Article History
Received: 21 December 2019
First Online: 15 April 2020