Electromigration Induced Break-up Phenomena in Liquid Metal Printed Thin Films
Crossref DOI link: https://doi.org/10.1007/s11664-014-3366-0
Published Online: 2014-08-26
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ma, Rongchao
Guo, Cangran
Zhou, Yixin
Liu, Jing
Text and Data Mining valid from 2014-08-26