Structural and Thermoelectric Properties of Nanocrystalline Bismuth Telluride Thin Films Under Compressive and Tensile Strain
Crossref DOI link: https://doi.org/10.1007/s11664-014-3496-4
Published Online: 2014-11-04
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kusagaya, K.
Hagino, H.
Tanaka, S.
Miyazaki, K.
Takashiri, M.
Text and Data Mining valid from 2014-11-04