Investigation of ICPECVD Silicon Nitride Films for HgCdTe Surface Passivation
Crossref DOI link: https://doi.org/10.1007/s11664-015-3703-y
Published Online: 2015-03-06
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, J.
Umana-Membreno, G.A.
Gu, R.
Lei, W.
Antoszewski, J.
Dell, J.M.
Faraone, L.
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