Nitrogen-Doped Ge10Sb90 Phase Change Thin Films for High-Temperature Data Retention and High-Speed Application
Crossref DOI link: https://doi.org/10.1007/s11664-015-3915-1
Published Online: 2015-07-01
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhu, X.Q.
Hu, Y.F.
Yuan, L.
Sui, Y.X.
Xue, J.Z.
Shen, D.H.
Zhang, J.H.
Song, S.N.
Song, Z.T.
Text and Data Mining valid from 2015-07-01