Effect of Temperature on Formation and Stability of Shallow Trap at a Dielectric Interface of the Multilayer
Crossref DOI link: https://doi.org/10.1007/s11664-015-4052-6
Published Online: 2015-09-29
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rogti, F. http://orcid.org/0000-0003-2230-1915
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