Understanding Electrical Conduction States in WO3 Thin Films Applied for Resistive Random-Access Memory
Crossref DOI link: https://doi.org/10.1007/s11664-016-4361-4
Published Online: 2016-02-18
Published Print: 2016-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ta, Thi Kieu Hanh
Pham, Kim Ngoc
Dao, Thi Bang Tam
Tran, Dai Lam
Phan, Bach Thang
Funding for this research was provided by:
Vietnam National University in Ho Chi Minh City (HS2015-18-02, B2013-18-02)
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