Effects of Annealing on Electrical Characteristics and Current Transport Mechanisms of the Y/p-GaN Schottky Diode
Crossref DOI link: https://doi.org/10.1007/s11664-016-4490-9
Published Online: 2016-04-12
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Reddy, V. Rajagopal
Asha, B.
Choi, Chel-Jong
Text and Data Mining valid from 2016-04-12