Passivation Effect of Atomic Layer Deposition of Al2O3 Film on HgCdTe Infrared Detectors
Crossref DOI link: https://doi.org/10.1007/s11664-016-4686-z
Published Online: 2016-06-07
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhang, Peng
Ye, Zhen-Hua
Sun, Chang-Hong
Chen, Yi-Yu
Zhang, Tian-Ning
Chen, Xin
Lin, Chun
Ding, Ring-Jun
He, Li
License valid from 2016-06-07