Growth and Characterization of Single Crystalline InN Grown on GaN by RF Sputtering for Robust Schottky Contacts
Crossref DOI link: https://doi.org/10.1007/s11664-016-5030-3
Published Online: 2016-10-20
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Harotoonian, Vache http://orcid.org/0000-0003-4033-9626
Woodall, Jerry M.
License valid from 2016-10-20