X-ray Photoelectron Spectroscopy Study of Indium Tin Oxide Films Deposited at Various Oxygen Partial Pressures
Crossref DOI link: https://doi.org/10.1007/s11664-016-5136-7
Published Online: 2016-11-28
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Peng, Shou
Cao, Xin
Pan, Jingong
Wang, Xinwei
Tan, Xuehai http://orcid.org/0000-0002-8571-1586
Delahoy, Alan E.
Chin, Ken K.
Funding for this research was provided by:
China Triumph International Engineering Co. Ltd.
License valid from 2016-11-28