Integration and High-Temperature Characterization of Ferroelectric Vanadium-Doped Bismuth Titanate Thin Films on Silicon Carbide
Crossref DOI link: https://doi.org/10.1007/s11664-017-5447-3
Published Online: 2017-03-20
Published Print: 2017-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ekström, Mattias http://orcid.org/0000-0002-1016-6085
Khartsev, Sergiy
Östling, Mikael
Zetterling, Carl-Mikael http://orcid.org/0000-0001-8108-2631
Funding for this research was provided by:
Knut och Alice Wallenbergs Stiftelse
License valid from 2017-03-20