Investigation of Si and O Donor Impurities in Unintentionally Doped MBE-Grown GaN on SiC(0001) Substrate
Crossref DOI link: https://doi.org/10.1007/s11664-017-5484-y
Published Online: 2017-04-06
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tingberg, Tobias
Ive, Tommy
Larsson, Anders
Funding for this research was provided by:
Energimyndigheten (35524-1)
License valid from 2017-04-06