Micro-diffraction Investigation of Localized Strain in Mesa-etched HgCdTe Photodiodes
Crossref DOI link: https://doi.org/10.1007/s11664-017-5691-6
Published Online: 2017-07-24
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tuaz, Aymeric http://orcid.org/0000-0001-8143-0309
Ballet, Philippe
Biquard, Xavier
Rieutord, François
License valid from 2017-07-24