Electron Device Subjected to Temperature Cycling: Predicted Time-to-Failure
Crossref DOI link: https://doi.org/10.1007/s11664-018-06867-z
Published Online: 2018-12-19
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Suhir, Ephraim http://orcid.org/0000-0002-6548-7302
Ghaffarian, Reza
Text and Data Mining valid from 2018-12-19
Article History
Received: 23 August 2018
Accepted: 7 December 2018
First Online: 19 December 2018