The Effect of Thermal Annealing and Measurement Temperature on Interface State Density Distribution and Time Constant in Ni/n-GaP Rectifying Contacts
Crossref DOI link: https://doi.org/10.1007/s11664-018-6192-y
Published Online: 2018-03-08
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ejderha, K. http://orcid.org/0000-0001-6883-9580
Orak, I.
Duman, S.
Turut, A.
Text and Data Mining valid from 2018-03-08
Article History
Received: 16 October 2017
Accepted: 1 March 2018
First Online: 8 March 2018