Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures
Crossref DOI link: https://doi.org/10.1007/s11664-018-6195-8
Published Online: 2018-03-12
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Badali, Yosef
Nikravan, Afsoun
Altındal, Şemsettin
Uslu, İbrahim
Text and Data Mining valid from 2018-03-12
Article History
Received: 17 November 2017
Accepted: 1 March 2018
First Online: 12 March 2018