Effectuality of Barrier Height Inhomogeneity on the Current–Voltage–Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer
Crossref DOI link: https://doi.org/10.1007/s11664-018-6495-z
Published Online: 2018-07-11
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Taşçıoğlu, İlke http://orcid.org/0000-0001-9563-4396
Tan, Serhat Orkun
Yakuphanoğlu, Fahrettin
Altındal, Şemsettin
Text and Data Mining valid from 2018-07-11
Article History
Received: 16 March 2018
Accepted: 29 June 2018
First Online: 11 July 2018