Comparative Study of Optical and Electrical Properties of Grown-In and Freshly Introduced Dislocations in GaN by SEM Methods
Crossref DOI link: https://doi.org/10.1007/s11664-019-07930-z
Published Online: 2020-01-03
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vergeles, P. S. http://orcid.org/0000-0002-9037-5089
Yakimov, E. B.
Orlov, V. I.
Text and Data Mining valid from 2020-01-03
Version of Record valid from 2020-01-03
Article History
Received: 15 November 2019
Accepted: 24 December 2019
First Online: 3 January 2020