Charging Effects in Al-SiO2-p-Si Structures After Low-Energy Electron Beam Irradiation
Crossref DOI link: https://doi.org/10.1007/s11664-020-08080-3
Published Online: 2020-03-28
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vergeles, P. S.
Kulanchikov, Yu. O.
Yakimov, E. B.
Text and Data Mining valid from 2020-03-28
Version of Record valid from 2020-03-28
Article History
Received: 19 November 2019
Accepted: 13 March 2020
First Online: 28 March 2020