Charge-Plasma-Based Negative Capacitance Ring-FET: Design, Investigation and Reliability Analysis
Crossref DOI link: https://doi.org/10.1007/s11664-020-08205-8
Published Online: 2020-05-23
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, Ashok Kumar
Raman, Ashish
Kumar, Naveen http://orcid.org/0000-0002-4765-1789
Text and Data Mining valid from 2020-05-23
Version of Record valid from 2020-05-23
Article History
Received: 7 November 2019
Accepted: 6 May 2020
First Online: 23 May 2020