Fabrication and Characterization of TiO2 Thin Film–Nanorod-Based Hybrid Structures for Memristor Applications
Crossref DOI link: https://doi.org/10.1007/s11664-023-10733-y
Published Online: 2023-11-01
Published Print: 2024-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Roy, S.
Tripathy, N.
Pradhan, D.
Sahu, P. K.
Kar, J. P.
Text and Data Mining valid from 2023-11-01
Version of Record valid from 2023-11-01
Article History
Received: 25 April 2023
Accepted: 13 September 2023
First Online: 1 November 2023
Conflict of interest
: The authors declare that they have no conflict of interest.