SSIM-based distortion metric for film grain noise in HEVC
Crossref DOI link: https://doi.org/10.1007/s11760-017-1184-6
Published Online: 2017-10-16
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Seongwan
Pak, Daehyun
Lee, Sangyoun
License valid from 2017-10-16