Measurement of thin liquid film thickness in pipes based on optical interferometry
Crossref DOI link: https://doi.org/10.1007/s11801-022-2022-9
Published Online: 2022-09-02
Published Print: 2022-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xue, Ting
Wu, Yan
Text and Data Mining valid from 2022-08-01
Version of Record valid from 2022-08-01
Article History
Received: 11 February 2022
Revised: 7 April 2022
First Online: 2 September 2022