Study and characterization of W/Si and W/B4C multilayer for applications in hard X-rays mirror
Crossref DOI link: https://doi.org/10.1007/s11814-015-0068-0
Published Online: 2015-08-17
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Chang Kyu
Park, Young Sei
Han, Sei Jin
Chae, Jang yool
Na, Byung-Ki
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