EOS<sup>®</sup> biplanar X-ray imaging: Concept, developments, benefits, and limitations
Crossref DOI link: https://doi.org/10.1007/s11832-016-0713-0
Published Online: 2016-02-01
Published Print: 2016-02
Update policy: https://doi.org/10.1177/sage-journals-update-policy
Melhem, Elias
Assi, Ayman
El Rachkidi, Rami
Ghanem, Ismat
License valid from 2016-02-01