Junction edge passivation study of silicon surface barrier detectors using organic films deposited by L–B technique
Crossref DOI link: https://doi.org/10.1007/s12034-019-1948-4
Published Online: 2019-10-04
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ray, A
Choudhury, Sipra
Singh, Vishal
Betty, C A
Rao, T V Chandrasekhar
Text and Data Mining valid from 2019-10-04
Version of Record valid from 2019-10-04
Article History
Received: 16 October 2018
Accepted: 25 February 2019
First Online: 4 October 2019