Effect of oxygen vacancies on dielectric property and reliability of anti-ferroelectric PLZT applicable to EV-MLCC
Crossref DOI link: https://doi.org/10.1007/s12034-023-03105-z
Published Online: 2024-02-17
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Choi, Jeoung Sik
Kim, Dong Chul
Shin, Hyo Soon http://orcid.org/0000-0002-2102-5763
Yeo, Dong Hun
Lee, Joon Hyung
Text and Data Mining valid from 2024-02-17
Version of Record valid from 2024-02-17
Article History
Received: 29 May 2023
Accepted: 4 September 2023
First Online: 17 February 2024